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Embedded Boundary Scan
March/April 2003 (vol. 20 no. 2)
pp. 20-25
Bradford G. Van Treuren, Lucent Technologies
Jose M. Miranda, Lucent Technologies

Editor?s note:

As boundary scan technology continues to mature, engineers continue tofind innovative ways of using the IEEE Std. 1149.1 facilities throughout thelife cycle of a board. Lucent Technologies is at the forefront of thisdevelopment, and the authors here describe how they have expanded theuse and reuse of the IEEE 1149.1 board tests into a variety of additional testenvironments.
--R.G. (Ben) Bennetts
Bennetts Associates

Citation:
Bradford G. Van Treuren, Jose M. Miranda, "Embedded Boundary Scan," IEEE Design & Test of Computers, vol. 20, no. 2, pp. 20-25, March-April 2003, doi:10.1109/MDT.2003.1188258
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