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IEEE Design & Test of Computers
January/February 2003 (vol. 20 no. 1)
ISSN: 0740-7475
Table of Contents
EIC Message
Features
Alex Orailoglu, University of California, San Diego
Alex Veidenbaum, University of California, Irvine
pp. 6-7
Wolfgang Raab, Infineon Technologies AG
Nico Bruels, Infineon Technologies AG
Ulrich Hachmann, Infineon Technologies AG
Jens Harnisch, Infineon Technologies AG
Ulrich Ramacher, Infineon Technologies AG
Christian Sauer, Infineon Technologies AG
Axel Techmer, Infineon Technologies AG
pp. 8-16
Jong-eun Lee, Seoul National University
Kiyoung Choi, Seoul National University
Nikil D. Dutt, University of California, Irvine
pp. 26-33
Oliver Wahlen, Aachen University of Technology
Manuel Hohenauer, Aachen University of Technology
Rainer Leupers, Aachen University of Technology
Heinrich Meyr, Aachen University of Technology
pp. 34-41
Special Features
Grzegorz Mrugalski, Poznan University of Technology
Jerzy Tyszer, Poznan University of Technology
Janusz Rajski, Mentor Graphics
pp. 51-59
Florence Aza?, LIRMM, University of Montpellier
Yves Bertrand, LIRMM, University of Montpellier
Michel Renovell, LIRMM, University of Montpellier
Andr? Ivanov, University of British Columbia
Sassan Tabatabaei, University of British Columbia
pp. 60-67
Luigi Carro, Universidade Federal do Rio Grande do Sul
Marcelo Negreiros, Universidade Federal do Rio Grande do Sul
Gabriel Parmegiani Jahn, Universidade Federal do Rio Grande do Sul
Ad?o Ant?nio de Souza Jr., Universidade Federal do Rio Grande do Sul
Denis Teixeira Franco, Universidade Federal do Rio Grande do Sul
pp. 76-84
The Road Ahead
Error Tolerance (Abstract)
Andrew B. Kahng, University of California, San Diego
pp. 86-87
Panel Summarie
ITC 2002 Panels (Abstract)
pp. 88-90
Standards
Conference Reports
Newsletters
TTTC Newsletter (Abstract)
pp. 94-95
The Last Byte
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