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An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs
January/February 2003 (vol. 20 no. 1)
pp. 60-67
Florence Aza?, LIRMM, University of Montpellier
Yves Bertrand, LIRMM, University of Montpellier
Michel Renovell, LIRMM, University of Montpellier
Andr? Ivanov, University of British Columbia
Sassan Tabatabaei, University of British Columbia

Traditional functional testing of mixed-signal ICs is slow and requires costly, dedicated test equipment. The authors update the standard PLL architecture to allow simple digital testing. The all-digital strategy yields catastrophic fault coverage as high as that of the classical functional test, plus it is fast, extremely simple to implement, and requires only standard digital test equipment.

Florence Aza?, Yves Bertrand, Michel Renovell, Andr? Ivanov, Sassan Tabatabaei, "An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs," IEEE Design & Test of Computers, vol. 20, no. 1, pp. 60-67, Jan.-Feb. 2003, doi:10.1109/MDT.2003.1173054
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