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| "Annual Index," IEEE Design & Test of Computers, vol. 19, no. 6, pp. 110-119, November/December, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.10042, author = {}, title = {Annual Index}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {6}, issn = {0740-7475}, year = {2002}, pages = {110-119}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.10042}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Annual Index IS - 6 SN - 0740-7475 SP110 EP119 EPD - 110-119 PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"Annual Index," IEEE Design & Test of Computers, vol. 19, no. 6, pp. 110-119, Nov.-Dec. 2002, doi:10.1109/MDT.2002.10042
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