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Issue No.06 - November/December (2002 vol.19)
pp: 83-89
ABSTRACT
<p>Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.</p>
CITATION
Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing", IEEE Design & Test of Computers, vol.19, no. 6, pp. 83-89, November/December 2002, doi:10.1109/MDT.2002.1047747
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