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Improving Defect Detection in Static-Voltage Testing
November/December 2002 (vol. 19 no. 6)
pp. 83-89

Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.

Citation:
Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing," IEEE Design & Test of Computers, vol. 19, no. 6, pp. 83-89, Nov.-Dec. 2002, doi:10.1109/MDT.2002.1047747
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