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Improving Defect Detection in Static-Voltage Testing
November/December 2002 (vol. 19 no. 6)
pp. 83-89
| ASCII Text | x | ||
| Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing," IEEE Design & Test of Computers, vol. 19, no. 6, pp. 83-89, November/December, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.1047747, author = {Michel Renovell and Florence Azaïs and Yves Bertrand}, title = {Improving Defect Detection in Static-Voltage Testing}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {6}, issn = {0740-7475}, year = {2002}, pages = {83-89}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1047747}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Improving Defect Detection in Static-Voltage Testing IS - 6 SN - 0740-7475 SP83 EP89 EPD - 83-89 A1 - Michel Renovell, A1 - Florence Azaïs, A1 - Yves Bertrand, PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.
Citation:
Michel Renovell, Florence Azaïs, Yves Bertrand, "Improving Defect Detection in Static-Voltage Testing," IEEE Design & Test of Computers, vol. 19, no. 6, pp. 83-89, Nov.-Dec. 2002, doi:10.1109/MDT.2002.1047747
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