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2002
Issue No. 5 - September/October
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IEEE Design & Test of Computers
September/October 2002 (vol. 19 no. 5)
ISSN: 0740-7475
Table of Contents
EIC Message
Sustaining an Industry Obsession
(Abstract)
Rajesh Gupta
pp. 1
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Features
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era
(HTML)
Jaume Segura
Peter Maxwell
pp. 5-7
ABSTRACT
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IDDQ Test: Will It Survive the DSM Challenge?
(Abstract)
Sagar S. Sabade
D.M.H. Walker
pp. 8-16
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Resistance Characterization for Weak Open Defects
(Abstract)
Rosa Rodríguez Montañés
Paul Volf
José Pineda de Gyvez
pp. 18-26
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Noise Generation and Coupling Mechanisms in Deep-Submicron ICs
(Abstract)
Xavier Aragonès
Jose Luis González
Francesc Moll
Antonio Rubio
pp. 27-35
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Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits
(Abstract)
Ali Keshavarzi
James W. Tschanz
Siva Narendra
Vivek De
W. Robert Daasch
Kaushik Roy
Manoj Sachdev
Charles F. Hawkins
pp. 36-43
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High Defect Coverage with Low-Power Test Sequences in a BIST Environment
(Abstract)
Patrick Girard
Christian Landrault
Serge Pravossoudovitch
Arnaud Virazel
Hans-Joachim Wunderlich
pp. 44-52
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Special ITC Section
Guest Editors' Introduction: Stressing the Fundamentals
(HTML)
Robert C. Aitken
Donald L. Wheater
pp. 54-55
ABSTRACT
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Efficient Sequential Test Generation Based on Logic Simulation
(Abstract)
Shuo Sheng
Michael S. Hsiao
pp. 56-64
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Extending OPMISR beyond 10x Scan Test Efficiency
(Abstract)
Carl Barnhart
Vanessa Brunkhorst
Frank Distler
Owen Farnsworth
Andrew Ferko
Brion Keller
David Scott
Bernd Koenemann
Takeshi Onodera
pp. 65-72
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Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
(Abstract)
W. Robert Daasch
James McNames
Robert Madge
Kevin Cota
pp. 74-81
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Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers
(Abstract)
Sule Ozev
Christian V. Olgaard
Alex Orailoglu
pp. 82-91
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Special Feature
Virtual Simulation of Distributed IP-Based Designs
(Abstract)
Marcello Dalpasso
Alessandro Bogliolo
Luca Benini
pp. 92-104
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Roundtable
Formal Verification: Current Use and Future Perspectives
(Abstract)
pp. 105-113
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Conference Reports
Conference Reports
(Abstract)
pp. 114-115
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TTTC Newsletter
Test Technology TC Newsletter
(Abstract)
pp. 116-117
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DATC Newsletter
Design Automation Technical Committee Newsletter
(Abstract)
pp. 118
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Panel Summaries
How Useful are the ITC 02 SoC Test Benchmarks?
(Abstract)
Krishnendu Chakrabarty
Erik Jan Marinissen
pp. 120, 119
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