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Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers
September/October 2002 (vol. 19 no. 5)
pp. 82-91

As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components.

Citation:
Sule Ozev, Christian V. Olgaard, Alex Orailoglu, "Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 82-91, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033796
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