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Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers
September/October 2002 (vol. 19 no. 5)
pp. 82-91
| ASCII Text | x | ||
| Sule Ozev, Christian V. Olgaard, Alex Orailoglu, "Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 82-91, September/October, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.1033796, author = {Sule Ozev and Christian V. Olgaard and Alex Orailoglu}, title = {Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {5}, issn = {0740-7475}, year = {2002}, pages = {82-91}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033796}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers IS - 5 SN - 0740-7475 SP82 EP91 EPD - 82-91 A1 - Sule Ozev, A1 - Christian V. Olgaard, A1 - Alex Orailoglu, PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components.
Citation:
Sule Ozev, Christian V. Olgaard, Alex Orailoglu, "Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 82-91, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033796
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