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Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
September/October 2002 (vol. 19 no. 5)
pp. 74-81
| ASCII Text | x | ||
| W. Robert Daasch, James McNames, Robert Madge, Kevin Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 74-81, September/October, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.1033795, author = {W. Robert Daasch and James McNames and Robert Madge and Kevin Cota}, title = {Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {5}, issn = {0740-7475}, year = {2002}, pages = {74-81}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033795}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort IS - 5 SN - 0740-7475 SP74 EP81 EPD - 74-81 A1 - W. Robert Daasch, A1 - James McNames, A1 - Robert Madge, A1 - Kevin Cota, PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers.
Citation:
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 74-81, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033795
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