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Issue No.05 - September/October (2002 vol.19)
pp: 74-81
ABSTRACT
<p>To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers.</p>
CITATION
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota, "Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort", IEEE Design & Test of Computers, vol.19, no. 5, pp. 74-81, September/October 2002, doi:10.1109/MDT.2002.1033795
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