This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Extending OPMISR beyond 10x Scan Test Efficiency
September/October 2002 (vol. 19 no. 5)
pp. 65-72

Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time.

Citation:
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion Keller, David Scott, Bernd Koenemann, Takeshi Onodera, "Extending OPMISR beyond 10x Scan Test Efficiency," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 65-72, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033794
Usage of this product signifies your acceptance of the Terms of Use.