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Issue No.05 - September/October (2002 vol.19)
pp: 65-72
ABSTRACT
<p>Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time.</p>
CITATION
Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion Keller, David Scott, Bernd Koenemann, Takeshi Onodera, "Extending OPMISR beyond 10x Scan Test Efficiency", IEEE Design & Test of Computers, vol.19, no. 5, pp. 65-72, September/October 2002, doi:10.1109/MDT.2002.1033794
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