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Issue No.05 - September/October (2002 vol.19)
pp: 56-64
ABSTRACT
<p>A simple and highly efficient logic-simulation-based test generator uses a genetic algorithm to achieve both high fault coverage and short test generation times.</p>
CITATION
Shuo Sheng, Michael S. Hsiao, "Efficient Sequential Test Generation Based on Logic Simulation", IEEE Design & Test of Computers, vol.19, no. 5, pp. 56-64, September/October 2002, doi:10.1109/MDT.2002.1033793
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