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Efficient Sequential Test Generation Based on Logic Simulation
September/October 2002 (vol. 19 no. 5)
pp. 56-64

A simple and highly efficient logic-simulation-based test generator uses a genetic algorithm to achieve both high fault coverage and short test generation times.

Citation:
Shuo Sheng, Michael S. Hsiao, "Efficient Sequential Test Generation Based on Logic Simulation," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 56-64, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033793
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