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Noise Generation and Coupling Mechanisms in Deep-Submicron ICs
September/October 2002 (vol. 19 no. 5)
pp. 27-35
| ASCII Text | x | ||
| Xavier Aragonès, Jose Luis González, Francesc Moll, Antonio Rubio, "Noise Generation and Coupling Mechanisms in Deep-Submicron ICs," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 27-35, September/October, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.1033789, author = {Xavier Aragonès and Jose Luis González and Francesc Moll and Antonio Rubio}, title = {Noise Generation and Coupling Mechanisms in Deep-Submicron ICs}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {5}, issn = {0740-7475}, year = {2002}, pages = {27-35}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033789}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Noise Generation and Coupling Mechanisms in Deep-Submicron ICs IS - 5 SN - 0740-7475 SP27 EP35 EPD - 27-35 A1 - Xavier Aragonès, A1 - Jose Luis González, A1 - Francesc Moll, A1 - Antonio Rubio, PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
On-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques depends on the circuit, its implementation, and the possible physical failures and parasitic coupling models. This new demand for test technology practices precipitated the investigation of dI/dt and dV/dt noise generation and propagation mechanisms.
Citation:
Xavier Aragonès, Jose Luis González, Francesc Moll, Antonio Rubio, "Noise Generation and Coupling Mechanisms in Deep-Submicron ICs," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 27-35, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033789
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