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Issue No.05 - September/October (2002 vol.19)
pp: 18-26
ABSTRACT
<p>Strong open defects can cause a circuit tomalfunction, but even weak open defects cancause it to function poorly. Detecting weak opensis thus an important, but challenging, task.Characterizing weak opens can help researchersassess the need for delay fault tests.</p>
CITATION
Rosa Rodríguez Montañés, Paul Volf, José Pineda de Gyvez, "Resistance Characterization for Weak Open Defects", IEEE Design & Test of Computers, vol.19, no. 5, pp. 18-26, September/October 2002, doi:10.1109/MDT.2002.1033788
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