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Resistance Characterization for Weak Open Defects
September/October 2002 (vol. 19 no. 5)
pp. 18-26
| ASCII Text | x | ||
| Rosa Rodríguez Montañés, Paul Volf, José Pineda de Gyvez, "Resistance Characterization for Weak Open Defects," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 18-26, September/October, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2002.1033788, author = {Rosa Rodríguez Montañés and Paul Volf and José Pineda de Gyvez}, title = {Resistance Characterization for Weak Open Defects}, journal ={IEEE Design & Test of Computers}, volume = {19}, number = {5}, issn = {0740-7475}, year = {2002}, pages = {18-26}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033788}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Resistance Characterization for Weak Open Defects IS - 5 SN - 0740-7475 SP18 EP26 EPD - 18-26 A1 - Rosa Rodríguez Montañés, A1 - Paul Volf, A1 - José Pineda de Gyvez, PY - 2002 VL - 19 JA - IEEE Design & Test of Computers ER - | |||
Strong open defects can cause a circuit tomalfunction, but even weak open defects cancause it to function poorly. Detecting weak opensis thus an important, but challenging, task.Characterizing weak opens can help researchersassess the need for delay fault tests.
Citation:
Rosa Rodríguez Montañés, Paul Volf, José Pineda de Gyvez, "Resistance Characterization for Weak Open Defects," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 18-26, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033788
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