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Resistance Characterization for Weak Open Defects
September/October 2002 (vol. 19 no. 5)
pp. 18-26

Strong open defects can cause a circuit tomalfunction, but even weak open defects cancause it to function poorly. Detecting weak opensis thus an important, but challenging, task.Characterizing weak opens can help researchersassess the need for delay fault tests.

Citation:
Rosa Rodríguez Montañés, Paul Volf, José Pineda de Gyvez, "Resistance Characterization for Weak Open Defects," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 18-26, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033788
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