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IDDQ Test: Will It Survive the DSM Challenge?
September/October 2002 (vol. 19 no. 5)
pp. 8-16

Deep-submicron technologies pose difficultchallenges for IDDQ testing in the future. The lowthreshold voltage used by DSM devicesdecreases the defect resolution of IDDQ. However,because IDDQ is a valuable test method,researchers are working to augment IDDQ with othertest parameters to prolong its effectiveness.

Citation:
Sagar S. Sabade, D.M.H. Walker, "IDDQ Test: Will It Survive the DSM Challenge?," IEEE Design & Test of Computers, vol. 19, no. 5, pp. 8-16, Sept.-Oct. 2002, doi:10.1109/MDT.2002.1033787
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