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Jitter Testing for Gigabit Serial Communication Transceivers
January/February 2002 (vol. 19 no. 1)
pp. 66-74
ASCII Text
x 
 
Yi Cai, Bernd Laquai, Kent Luehman, "Jitter Testing for Gigabit Serial Communication Transceivers," IEEE Design & Test of Computers, vol. 19, no. 1, pp. 66-74, January/February, 2002.
 
 
BibTex
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@article{ 10.1109/54.980054,
author = {Yi Cai and Bernd Laquai and Kent Luehman},
title = {Jitter Testing for Gigabit Serial Communication Transceivers},
journal ={IEEE Design & Test of Computers},
volume = {19},
number = {1},
issn = {0740-7475},
year = {2002},
pages = {66-74},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.980054},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Jitter Testing for Gigabit Serial Communication Transceivers
IS - 1
SN - 0740-7475
SP66
EP74
EPD - 66-74
A1 - Yi Cai,
A1 - Bernd Laquai,
A1 - Kent Luehman,
PY - 2002
VL - 19
JA - IEEE Design & Test of Computers
ER -
 

Proper testing of transceivers requires the ability not only to measure generated jitter but also to inject in-band as well as out-of-band jitter for an appropriate receiver tolerance test.

Citation:
Yi Cai, Bernd Laquai, Kent Luehman, "Jitter Testing for Gigabit Serial Communication Transceivers," IEEE Design & Test of Computers, vol. 19, no. 1, pp. 66-74, Jan.-Feb. 2002, doi:10.1109/54.980054
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