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Issue No.01 - January/February (2002 vol.19)
pp: 54-64
ABSTRACT
<p>Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models.</p>
CITATION
Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, "Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems", IEEE Design & Test of Computers, vol.19, no. 1, pp. 54-64, January/February 2002, doi:10.1109/54.980053
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