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Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST
January/February 2002 (vol. 19 no. 1)
pp. 42-53

Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan-based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.

Citation:
Ismet Bayraktaroglu, Alex Orailoglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST," IEEE Design & Test of Computers, vol. 19, no. 1, pp. 42-53, Jan.-Feb. 2002, doi:10.1109/54.980052
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