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Issue No.01 - January/February (2002 vol.19)
pp: 42-53
ABSTRACT
<p>Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan-based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.</p>
CITATION
Ismet Bayraktaroglu, Alex Orailoglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST", IEEE Design & Test of Computers, vol.19, no. 1, pp. 42-53, January/February 2002, doi:10.1109/54.980052
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