This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
High-Accuracy Flush-and-Scan Software Diagnostic
November/December 2001 (vol. 18 no. 6)
pp. 56-62

This software technique operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation.

Citation:
Kevin Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic," IEEE Design & Test of Computers, vol. 18, no. 6, pp. 56-62, Nov.-Dec. 2001, doi:10.1109/54.970425
Usage of this product signifies your acceptance of the Terms of Use.