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Issue No.06 - November/December (2001 vol.18)
pp: 56-62
ABSTRACT
<p>This software technique operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation.</p>
CITATION
Kevin Stanley, "High-Accuracy Flush-and-Scan Software Diagnostic", IEEE Design & Test of Computers, vol.18, no. 6, pp. 56-62, November/December 2001, doi:10.1109/54.970425
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