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Strategies for Low-Cost Test
November/December 2001 (vol. 18 no. 6)
pp. 47-54

More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.

Citation:
Rohit Kapur, R. Chandramouli, T.W. Williams, "Strategies for Low-Cost Test," IEEE Design & Test of Computers, vol. 18, no. 6, pp. 47-54, Nov.-Dec. 2001, doi:10.1109/54.970423
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