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Issue No.06 - November/December (2001 vol.18)
pp: 47-54
<p>More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.</p>
Rohit Kapur, R. Chandramouli, T.W. Williams, "Strategies for Low-Cost Test", IEEE Design & Test of Computers, vol.18, no. 6, pp. 47-54, November/December 2001, doi:10.1109/54.970423
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