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Test Resource Partitioning for SOCs
September/October 2001 (vol. 18 no. 5)
pp. 80-91

A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.

Citation:
Anshuman Chandra, Krishnendu Chakrabarty, "Test Resource Partitioning for SOCs," IEEE Design & Test of Computers, vol. 18, no. 5, pp. 80-91, Sept.-Oct. 2001, doi:10.1109/54.953275
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