This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Economics of Built-in Self-Test
September/October 2001 (vol. 18 no. 5)
pp. 70-79

Using built-in self-test at the right level offers users significant cost savings, but determining which level, if any, is best for BIST can be complex. A detailed economic analysis can unravel heterogeneous costs and benefits so that designers and managers can make the right decision.

Citation:
Louis Y. Ungar, Tony Ambler, "Economics of Built-in Self-Test," IEEE Design & Test of Computers, vol. 18, no. 5, pp. 70-79, Sept.-Oct. 2001, doi:10.1109/54.953274
Usage of this product signifies your acceptance of the Terms of Use.