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Issue No.05 - September/October (2001 vol.18)
pp: 60-69
ABSTRACT
<p>Prudent application of design-for-testability guidelines can yield designs that don't require all the expensive features of traditional automated test equipment. The authors describe how the VLSI design and semiconductor test communities can cooperate to greatly reduce testing costs.</p>
CITATION
Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir, "Very Low Cost Testers: Opportunities and Challenges", IEEE Design & Test of Computers, vol.18, no. 5, pp. 60-69, September/October 2001, doi:10.1109/54.953273
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