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Test Trade-Offs Take Center Stage at ITC
September/October 2001 (vol. 18 no. 5)
pp. 59
| ASCII Text | x | ||
| Tony Ambler, Donald Wheater, "Test Trade-Offs Take Center Stage at ITC," IEEE Design & Test of Computers, vol. 18, no. 5, pp. 59, September/October, 2001. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2001.953272, author = {Tony Ambler and Donald Wheater}, title = {Test Trade-Offs Take Center Stage at ITC}, journal ={IEEE Design & Test of Computers}, volume = {18}, number = {5}, issn = {0740-7475}, year = {2001}, pages = {59}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2001.953272}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Trade-Offs Take Center Stage at ITC IS - 5 SN - 0740-7475 SP EP EPD - 59 A1 - Tony Ambler, A1 - Donald Wheater, PY - 2001 VL - 18 JA - IEEE Design & Test of Computers ER - | |||
Citation:
Tony Ambler, Donald Wheater, "Test Trade-Offs Take Center Stage at ITC," IEEE Design & Test of Computers, vol. 18, no. 5, pp. 59, Sept.-Oct. 2001, doi:10.1109/MDT.2001.953272
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