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Test Trade-Offs Take Center Stage at ITC
September/October 2001 (vol. 18 no. 5)
pp. 59
Citation:
Tony Ambler, Donald Wheater, "Test Trade-Offs Take Center Stage at ITC," IEEE Design & Test of Computers, vol. 18, no. 5, pp. 59, Sept.-Oct. 2001, doi:10.1109/MDT.2001.953272
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