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IEEE Design & Test of Computers
July/August 2001 (vol. 18 no. 4)
ISSN: 0740-7475
Table of Contents
 | EIC Message |
 | Features |
 | Special Feature |
 | Roundtable |
 | Conference Reports |
 | Panel Summaries |
 | DATC Newsletter |
 | TTCC Newsletter |
 | The Last Byte |