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Using Electrical Bitmap Results from Embedded Memory to Enhance Yield
May/June 2001 (vol. 18 no. 3)
pp. 28-39
Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis.
Citation:
Julie Segal, Alvin Jee, David Lepejian, Ben Chu, "Using Electrical Bitmap Results from Embedded Memory to Enhance Yield," IEEE Design & Test of Computers, vol. 18, no. 3, pp. 28-39, May-June 2001, doi:10.1109/54.922801
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