Issue No.03 - May/June (2001 vol.18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.922801
Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis.
Julie Segal, Alvin Jee, David Lepejian, Ben Chu, "Using Electrical Bitmap Results from Embedded Memory to Enhance Yield", IEEE Design & Test of Computers, vol.18, no. 3, pp. 28-39, May/June 2001, doi:10.1109/54.922801