Issue No.03 - May/June (2001 vol.18)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.922800
Large on-chip memories are desirable but difficult to implement. Challenges range from design automation to fabrication to test algorithms and memory redundancy and repair.
Rochit Rajsuman, "Design and Test of Large Embedded Memories: An Overview", IEEE Design & Test of Computers, vol.18, no. 3, pp. 16-27, May/June 2001, doi:10.1109/54.922800