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Current-Based Testing for Deep-Submicron VLSIs
March/April 2001 (vol. 18 no. 2)
pp. 76-84
Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
Citation:
Manoj Sachdev, "Current-Based Testing for Deep-Submicron VLSIs," IEEE Design & Test of Computers, vol. 18, no. 2, pp. 76-84, March-April 2001, doi:10.1109/54.914627
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