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Hierarchical ATPG for Analog Circuits and Systems
January/February 2001 (vol. 18 no. 1)
pp. 72-81
ASCII Text
x 
 
Mani Soma, Sam Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, "Hierarchical ATPG for Analog Circuits and Systems," IEEE Design & Test of Computers, vol. 18, no. 1, pp. 72-81, January/February, 2001.
 
 
BibTex
x
 
@article{ 10.1109/54.902824,
author = {Mani Soma and Sam Huynh and Jinyan Zhang and Seongwon Kim and Giri Devarayanadurg},
title = {Hierarchical ATPG for Analog Circuits and Systems},
journal ={IEEE Design & Test of Computers},
volume = {18},
number = {1},
issn = {0740-7475},
year = {2001},
pages = {72-81},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.902824},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Hierarchical ATPG for Analog Circuits and Systems
IS - 1
SN - 0740-7475
SP72
EP81
EPD - 72-81
A1 - Mani Soma,
A1 - Sam Huynh,
A1 - Jinyan Zhang,
A1 - Seongwon Kim,
A1 - Giri Devarayanadurg,
PY - 2001
VL - 18
JA - IEEE Design & Test of Computers
ER -
 
This paper presents a hierarchical modeling technique which, when combined with a test pattern generation algorithm, forms a hierarchical automatic test pattern generation procedure for analog circuits and systems. This hierarchical procedure is demonstrated to be efficient in terms of both memory and computational speed, especially in processing large circuits. Several examples illustrate the hierarchical modeling technique. The test generation algorithm has been validated in several case studies, one of which is described in details. A prototype software tool is available for university and industry use, with possible enhancements to increase the tool applicability in specific design and test environments.
Citation:
Mani Soma, Sam Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, "Hierarchical ATPG for Analog Circuits and Systems," IEEE Design & Test of Computers, vol. 18, no. 1, pp. 72-81, Jan.-Feb. 2001, doi:10.1109/54.902824
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