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IC Diagnosis Using Multiple Supply Pad IDDQs
January/February 2001 (vol. 18 no. 1)
pp. 50-61
A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.
Citation:
Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs," IEEE Design & Test of Computers, vol. 18, no. 1, pp. 50-61, Jan.-Feb. 2001, doi:10.1109/54.902822
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