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Issue No.01 - January/February (2001 vol.18)
pp: 50-61
ABSTRACT
A IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects.
CITATION
Jim Plusquellic, "IC Diagnosis Using Multiple Supply Pad IDDQs", IEEE Design & Test of Computers, vol.18, no. 1, pp. 50-61, January/February 2001, doi:10.1109/54.902822
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