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Fault Detection and Location Using IDD Waveform Analysis
January/February 2001 (vol. 18 no. 1)
pp. 42-49
IDD waveform analysis can detect defects that IDDQ testing cannot. An investigation of IDD waveform analysis methods-one based on integrators, one on fast Fourier transform-confirms that such analysis enables fault localization testing in static and dynamic CMOS circuits.
Citation:
Khurram Muhammad, Kaushik Roy, "Fault Detection and Location Using IDD Waveform Analysis," IEEE Design & Test of Computers, vol. 18, no. 1, pp. 42-49, Jan.-Feb. 2001, doi:10.1109/54.902821
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