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Defect-Oriented Testing and Defective-Part-Level Prediction
January/February 2001 (vol. 18 no. 1)
pp. 31-41
A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.
Citation:
Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang, "Defect-Oriented Testing and Defective-Part-Level Prediction," IEEE Design & Test of Computers, vol. 18, no. 1, pp. 31-41, Jan.-Feb. 2001, doi:10.1109/54.902820
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