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Issue No.01 - January/February (2001 vol.18)
pp: 31-41
ABSTRACT
A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.
CITATION
Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang, "Defect-Oriented Testing and Defective-Part-Level Prediction", IEEE Design & Test of Computers, vol.18, no. 1, pp. 31-41, January/February 2001, doi:10.1109/54.902820
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