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Issue No.01 - January/February (2001 vol.18)
pp: 8-9
CITATION
Fabrizio Lombardi, Cecilia Metra, "Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems", IEEE Design & Test of Computers, vol.18, no. 1, pp. 8-9, January/February 2001, doi:10.1109/MDT.2001.902817
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