Issue No.04 - October-December (2000 vol.17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.895006
Research on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort.
David Van Campenhout, Trevor Mudge, John P. Hayes, "Collection and Analysis of Microprocessor Design Errors", IEEE Design & Test of Computers, vol.17, no. 4, pp. 51-60, October-December 2000, doi:10.1109/54.895006