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Issue No.03 - July-September (2000 vol.17)
pp: 116-124
ABSTRACT
<p>A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets.</p>
CITATION
Seung H. Hwang, Gwan S. Choi, "A Reliability Testing Environment for Off-the-Shelf Memory Subsystems", IEEE Design & Test of Computers, vol.17, no. 3, pp. 116-124, July-September 2000, doi:10.1109/54.867902
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