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Issue No.03 - July-September (2000 vol.17)
pp: 106-115
ABSTRACT
<p>For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits.</p>
CITATION
Pramodchandran N. Variyam, Abhijit Chatterjee, "Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling", IEEE Design & Test of Computers, vol.17, no. 3, pp. 106-115, July-September 2000, doi:10.1109/54.867901
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