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Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling
July-September 2000 (vol. 17 no. 3)
pp. 106-115

For complex mixed-signal designs, BIST is becoming a necessity. The BIST scheme presented here maximizes coverage of parametric and catastrophic failures and provides an all-digital BIST solution to analog circuits.

Citation:
Pramodchandran N. Variyam, Abhijit Chatterjee, "Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling," IEEE Design & Test of Computers, vol. 17, no. 3, pp. 106-115, July-Sept. 2000, doi:10.1109/54.867901
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