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Issue No.03 - July-September (2000 vol.17)
pp: 44-53
ABSTRACT
<p>New design flows require reducing work at the gate level and perfoming most activities before the synthesis step, including evaluatation of testability of circuits. We propose a suite of RT-level benchmarks that help improve research in high-level ATPG tools. First results on the benchmarks obtained with our prototype tool show the feasibility of the approach.</p>
CITATION
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero, "RT-Level ITC'99 Benchmarks and First ATPG Results", IEEE Design & Test of Computers, vol.17, no. 3, pp. 44-53, July-September 2000, doi:10.1109/54.867894
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