Issue No.03 - July-September (2000 vol.17)
pp: 34-42
<p>This article presents a method for inserting test logic at the behavioral level of a VHDL design description. The method is easy to use, and in most cases it requires lower area overhead than classical scan insertion methods.</p>
Chouki Aktouf, Chantal Robach, "Inserting Scan at the Behavioral Level", IEEE Design & Test of Computers, vol.17, no. 3, pp. 34-42, July-September 2000, doi:10.1109/54.867892