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Issue No.03 - July-September (2000 vol.17)
pp: 18-21
ABSTRACT
<p>The monitoring of three ATPG tool parameters—fault coverage, test generation time, and test vector count—has improved test benchmarking over the years. Changing test dynamics, however, requires a different test metric.</p>
CITATION
Rohit Kapur, Cy Hay, T.w. Williams, "The Mutating Metric for Benchmarking Test", IEEE Design & Test of Computers, vol.17, no. 3, pp. 18-21, July-September 2000, doi:10.1109/54.867890
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