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Wider Coverage
July-September 2000 (vol. 17 no. 3)
pp. 6
ASCII Text
x 
 
Yervant Zorian, "Wider Coverage," IEEE Design & Test of Computers, vol. 17, no. 3, pp. 6, July-September, 2000.
 
 
BibTex
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@article{ 10.1109/MDT.2000.10018,
author = {Yervant Zorian},
title = {Wider Coverage},
journal ={IEEE Design & Test of Computers},
volume = {17},
number = {3},
issn = {0740-7475},
year = {2000},
pages = {6},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2000.10018},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Wider Coverage
IS - 3
SN - 0740-7475
SP
EP
EPD - 6
A1 - Yervant Zorian,
PY - 2000
VL - 17
JA - IEEE Design & Test of Computers
ER -
 
IEEE Design & Test of Computers continues its coverage of a wide range of topics to contribute to professional advancement of its readers and to advance the state of the art in electronic design and test. With this issue, D&T goes beyond its traditional coverage by extending the above contribution to people attending the IEEE International Test Conference (ITC) 2000 and by featuring a broader topical coverage. The readership increase of this issue and wide selection of articles are courtesy of an annual grant from the ITC. This grant sponsors 32 additional pages in the July-Sept. issue with a timely test technology theme. The same grant allows us to widen the readership of this issue by distribution to all ITC attendees.
Citation:
Yervant Zorian, "Wider Coverage," IEEE Design & Test of Computers, vol. 17, no. 3, pp. 6, July-Sept. 2000, doi:10.1109/MDT.2000.10018
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