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Issue No.02 - April-June (2000 vol.17)
pp: 86-93
ABSTRACT
<p>Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured—not just the jitter.</p>
CITATION
Keith A. Jenkins, James P. Eckhardt, "Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops", IEEE Design & Test of Computers, vol.17, no. 2, pp. 86-93, April-June 2000, doi:10.1109/54.844337
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