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Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
April-June 2000 (vol. 17 no. 2)
pp. 86-93
| ASCII Text | x | ||
| Keith A. Jenkins, James P. Eckhardt, "Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops," IEEE Design & Test of Computers, vol. 17, no. 2, pp. 86-93, April-June, 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/54.844337, author = {Keith A. Jenkins and James P. Eckhardt}, title = {Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops}, journal ={IEEE Design & Test of Computers}, volume = {17}, number = {2}, issn = {0740-7475}, year = {2000}, pages = {86-93}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.844337}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops IS - 2 SN - 0740-7475 SP86 EP93 EPD - 86-93 A1 - Keith A. Jenkins, A1 - James P. Eckhardt, PY - 2000 VL - 17 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.844337
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured—not just the jitter.
Citation:
Keith A. Jenkins, James P. Eckhardt, "Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops," IEEE Design & Test of Computers, vol. 17, no. 2, pp. 86-93, April-June 2000, doi:10.1109/54.844337
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