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Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
April-June 2000 (vol. 17 no. 2)
pp. 86-93

Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured—not just the jitter.

Citation:
Keith A. Jenkins, James P. Eckhardt, "Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops," IEEE Design & Test of Computers, vol. 17, no. 2, pp. 86-93, April-June 2000, doi:10.1109/54.844337
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