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Issue No.04 - October-December (1999 vol.16)
pp: 14-15
CITATION
Charles F. Hawkins, Jerry M. Soden, "Deep Submicron CMOS Current IC Testing: Is There a Future?", IEEE Design & Test of Computers, vol.16, no. 4, pp. 14-15, October-December 1999, doi:10.1109/MDT.1999.808198
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