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Deep Submicron CMOS Current IC Testing: Is There a Future?
October-December 1999 (vol. 16 no. 4)
pp. 14-15
| ASCII Text | x | ||
| Charles F. Hawkins, Jerry M. Soden, "Deep Submicron CMOS Current IC Testing: Is There a Future?," IEEE Design & Test of Computers, vol. 16, no. 4, pp. 14-15, October-December, 1999. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1999.808198, author = {Charles F. Hawkins and Jerry M. Soden}, title = {Deep Submicron CMOS Current IC Testing: Is There a Future?}, journal ={IEEE Design & Test of Computers}, volume = {16}, number = {4}, issn = {0740-7475}, year = {1999}, pages = {14-15}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1999.808198}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Deep Submicron CMOS Current IC Testing: Is There a Future? IS - 4 SN - 0740-7475 SP14 EP15 EPD - 14-15 A1 - Charles F. Hawkins, A1 - Jerry M. Soden, PY - 1999 VL - 16 JA - IEEE Design & Test of Computers ER - | |||
Citation:
Charles F. Hawkins, Jerry M. Soden, "Deep Submicron CMOS Current IC Testing: Is There a Future?," IEEE Design & Test of Computers, vol. 16, no. 4, pp. 14-15, Oct.-Dec. 1999, doi:10.1109/MDT.1999.808198
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