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Issue No.03 - July-September (1999 vol.16)
pp: 112-116
CITATION
"A D&T Roundtable: RF Integration into CMOS and Deep-Submicron Challenges", IEEE Design & Test of Computers, vol.16, no. 3, pp. 112-116, July-September 1999, doi:10.1109/MDT.1999.10017
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