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Boundary Scan: The Internet of Test
July-September 1999 (vol. 16 no. 3)
pp. 34-43
ASCII Text
x 
 
Mike Wondolowski, Ben Bennetts, Adam Ley, "Boundary Scan: The Internet of Test," IEEE Design & Test of Computers, vol. 16, no. 3, pp. 34-43, July-September, 1999.
 
 
BibTex
x
 
@article{ 10.1109/54.785829,
author = {Mike Wondolowski and Ben Bennetts and Adam Ley},
title = {Boundary Scan: The Internet of Test},
journal ={IEEE Design & Test of Computers},
volume = {16},
number = {3},
issn = {0740-7475},
year = {1999},
pages = {34-43},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.785829},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Boundary Scan: The Internet of Test
IS - 3
SN - 0740-7475
SP34
EP43
EPD - 34-43
A1 - Mike Wondolowski,
A1 - Ben Bennetts,
A1 - Adam Ley,
PY - 1999
VL - 16
JA - IEEE Design & Test of Computers
ER -
 
Since the publication of the ANSI/IEEE 1149.1 Boundary Scan standard in 1990, the electronics manufacturing industry has steadily accepted boundary-scan technology. Initially, boundary scan technology focused on the application to board manufacturing test. More recently, in-system programming (ISP) applications of boundary scan have further increased interest in the standard. One of the biggest advantages of using boundary scan is the ability to reuse tests developed at different levels of the design and in different life cycle phases. This facilitation of communication between previously isolated areas results in a network of re-use-the "Internet of Test."
Citation:
Mike Wondolowski, Ben Bennetts, Adam Ley, "Boundary Scan: The Internet of Test," IEEE Design & Test of Computers, vol. 16, no. 3, pp. 34-43, July-Sept. 1999, doi:10.1109/54.785829
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