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Design for Test and Time to Market: A Personal Perspective
July-September 1999 (vol. 16 no. 3)
pp. 23-27
This article explores current and future design for test implementation alternatives, including their impact on various product performance, yield, and test development time characteristics. It also discusses the relationship between electronic design for test automation and its effects on overall time to market for application-specific and system-on-chip (SoC) integrated circuits (ICs).
Citation:
Jon Turino, "Design for Test and Time to Market: A Personal Perspective," IEEE Design & Test of Computers, vol. 16, no. 3, pp. 23-27, July-Sept. 1999, doi:10.1109/54.785824
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