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Issue No.03 - July-September (1999 vol.16)
pp: 20-22
CITATION
Tony Ambler, Ben Bennetts, "Guest Editors' Introduction: Test and the Product Life Cycle", IEEE Design & Test of Computers, vol.16, no. 3, pp. 20-22, July-September 1999, doi:10.1109/MDT.1999.785823
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