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IC Reliability and Test: What Will Deep Submicron Bring?
April-June 1999 (vol. 16 no. 2)
pp. 84-91
Citation:
"IC Reliability and Test: What Will Deep Submicron Bring?," IEEE Design & Test of Computers, vol. 16, no. 2, pp. 84-91, April-June 1999, doi:10.1109/MDT.1999.10010
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