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The Third Millennium's Test Dilemma
October-December 1998 (vol. 15 no. 4)
pp. 7-11
| ASCII Text | x | ||
| Bill Bottoms, "The Third Millennium's Test Dilemma," IEEE Design & Test of Computers, vol. 15, no. 4, pp. 7-11, October-December, 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/54.735921, author = {Bill Bottoms}, title = {The Third Millennium's Test Dilemma}, journal ={IEEE Design & Test of Computers}, volume = {15}, number = {4}, issn = {0740-7475}, year = {1998}, pages = {7-11}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.735921}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - The Third Millennium's Test Dilemma IS - 4 SN - 0740-7475 SP7 EP11 EPD - 7-11 A1 - Bill Bottoms, PY - 1998 VL - 15 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.735921
The president and CEO of Credence Systems, Bill Bottoms, addressed the VLSI Test Symposium held last April in Monterey, California. His keynote covered some of the challenges test engineers must face in the future. Specifically, Bottoms focused on what's driving the increase in test cost and what the industry can do about it.
Citation:
Bill Bottoms, "The Third Millennium's Test Dilemma," IEEE Design & Test of Computers, vol. 15, no. 4, pp. 7-11, Oct.-Dec. 1998, doi:10.1109/54.735921
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