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Alpha 21164 Manufacturing Test Development and Coverage Analysis
July-September 1998 (vol. 15 no. 3)
pp. 98-104
Today's competitive market demands high quality levels for electronic devices including state-of-the-art microprocessors. Unfortunately, the full-custom design methodology and performance constraints of the Alpha 21164, a deep sub-micron, superscalar microprocessor, precluded brute force use of design-for-test (DFT) techniques such as full-scan insertion and automated test pattern generation. In addition, scan testing alone cannot guarantee the desired quality level for microprocessors in this genre. As a result, functional tests play a key role in achieving the quality goals of the Alpha 21164.
Index Terms:
Alpha 21164, manufacturing test, microprocessor testing, fault coverage, design for test (DFT)
Citation:
Carol J. Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong, "Alpha 21164 Manufacturing Test Development and Coverage Analysis," IEEE Design & Test of Computers, vol. 15, no. 3, pp. 98-104, July-Sept. 1998, doi:10.1109/54.706040
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