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Issue No.03 - July-September (1998 vol.15)
pp: 98-104
ABSTRACT
Today's competitive market demands high quality levels for electronic devices including state-of-the-art microprocessors. Unfortunately, the full-custom design methodology and performance constraints of the Alpha 21164, a deep sub-micron, superscalar microprocessor, precluded brute force use of design-for-test (DFT) techniques such as full-scan insertion and automated test pattern generation. In addition, scan testing alone cannot guarantee the desired quality level for microprocessors in this genre. As a result, functional tests play a key role in achieving the quality goals of the Alpha 21164.
INDEX TERMS
Alpha 21164, manufacturing test, microprocessor testing, fault coverage, design for test (DFT)
CITATION
Carol J. Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong, "Alpha 21164 Manufacturing Test Development and Coverage Analysis", IEEE Design & Test of Computers, vol.15, no. 3, pp. 98-104, July-September 1998, doi:10.1109/54.706040
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