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Testability Features of the AMD-K6 Microprocessor
July-September 1998 (vol. 15 no. 3)
pp. 64-69
This article describes the testability features and test pattern development methodologies for the AMD-K6 Microprocessor. The embedded Design for Testability (DFT) structures and test strategy provide high quality manufacturing tests.
Index Terms:
AMD-K6, design for testability, test strategies, manufacturing costs
Citation:
R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma, "Testability Features of the AMD-K6 Microprocessor," IEEE Design & Test of Computers, vol. 15, no. 3, pp. 64-69, July-Sept. 1998, doi:10.1109/54.706035
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