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Issue No.02 - April-June (1998 vol.15)
pp: 86-92
CITATION
Meh-Ron Amerian, William D. Atwell, Jr.,, Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T.w. Williams, Farzad Zarrinfar, Yervant Zorian, "A D&T Roundtable: Testing Mixed Logic and DRAM Chips", IEEE Design & Test of Computers, vol.15, no. 2, pp. 86-92, April-June 1998, doi:10.1109/MDT.1998.679212
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