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A D&T Roundtable: Testing Mixed Logic and DRAM Chips
April-June 1998 (vol. 15 no. 2)
pp. 86-92
Citation:
Meh-Ron Amerian, William D. Atwell, Jr.,, Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T.w. Williams, Farzad Zarrinfar, Yervant Zorian, "A D&T Roundtable: Testing Mixed Logic and DRAM Chips," IEEE Design & Test of Computers, vol. 15, no. 2, pp. 86-92, April-June 1998, doi:10.1109/MDT.1998.679212
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