The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.02 - April-June (1998 vol.15)
pp: 80-85
ABSTRACT
Fault models are introduced for analog components described on the functional level. Conditions for the output manifestation of functional faults are derived, with a spread in analog output values allowed for. The study made has shown that only the function of a faulty-free component may be used to select input test stimuli which should ensure the manifestation of its faults. The results obtained may be used to select test stimuli for analog printed-circuit board.
INDEX TERMS
Analog test, ICs, fault models, PCBs
CITATION
Yuri V. Malyshenko, "Functional Fault Models for Analog Circuits", IEEE Design & Test of Computers, vol.15, no. 2, pp. 80-85, April-June 1998, doi:10.1109/54.679211
35 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool